Konczykowska, A., Rozes, P., and Zuberek, W.M.
Alta Frequenza, vol.5, no.6, pp.3-5, 1993.
Abstract:
The knowledge of precise CAD models is very important for the design of high performance circuits. Extraction of model parameters is one of techniques used in device modeling. This paper describes an interactive, simulation-based, data-driven extraction program FIT, in which parameter extraction is formulated as an optimization problem. An enhancement of this program by using symbolic expression in the simulation part of the extraction program is also presented. The performance comparison including two different symbolic forms and the classical numerical approach is discussed. As an example, the submicronic GaAs FET on InP substrate modeling is performed using the enhanced extraction software.
Keywords:
Parameter extraction, symbolic circuit analysis, SPICE-PAC, FIT.